The research group has expertise in the following areas
fabrication and characterization of thin films, granular films, multilayers and laterally patterned multilayers for X-ray optics and giant magnetoresistance effect applications, spin valve structures, ultra high vacuum electron beam deposition, Ion Beam Sputtering deposition with in-situ ellipsometry control;
studies of surface and interface morphology in thin films and multilayers by specular X-ray reflectometry, grazing incidence diffuse scattering and reciprocal space mapping, analysis of multilayer structures. The extended software package is available for simulation of experimental data;
Magnetoresistance measurements at room temperature in magnetic field up to 1 T is performed; magnetiazation measurement of thin film samples by magneto-optical Kerr effect;
preparation of colloidal nanoparticles (Fe-O, Ag, Au), deposition of orderen nanoparticle mono and multilayers by Langmuir Schaefer technique, characterization of nanoparticle arrays by grazing incidence small angle X-ray scattering GISAXS, software for simulation of experimental data;
spectroscopic techniques based on the measuring of a transient response to the potential step (deep-level transient spectroscopy in both the temperature and rate-window scannig modes, capacitance–voltage measurements based on the feedback charge method, scanning probe microscopy and spectroscopy techniques) for nanostructure analysis and understanding of electronic phenomena in novel inorganic and organic materials and hybrid systems;
electrochemistry (cyclic voltammetry, steady-state voltammetry, kinetics sensitive voltcoulommetry) for understanding of electrochemical phenomena in layered hybrid systems;
fabrication and studies of organic solar cells, studies of incorporation of plasmonic nanoparticles in the solar cell structure.
Infrastructure
GISAXS laboratory instrumentation, AFM, Stylus profilometer, contact angle instrument, standard Langmuir–Blodgett trough, high-compression ratio Langmuir trough, digital microscope, laser scatterometer, UV-VIS-NIR spectrometer, vacuum deposition and sample annealing chambers, imaging ellipsometry, technological complex for fabrication OPV devices, set up for electrical measurements — I/V characteristics, Solar simulator, quantum efficiency measurement, Kelvin probe, standard chemistry laboratory and other small instruments, UV ns laser, scatterometer Ion beam sputtering apparatus, D8 Discover Super Speed Diffraction System with rotating anode and mirror optics (Consortium MULTIDISC).
