SAXS and in-situ SAXS to characterize structure and structural evolution in nanomaterials

Herwig Peterlik (University of Vienna, Austria)

Pavilón QUTE, Auditórium – 2. poschodie, FÚ SAV

Small-angle X-ray scattering (SAXS) is a powerful tool to obtain information on the size, shape, orientation and arrangement of nanoscaled objects. SAXS has – in comparison to concurrent or complementary techniques – the particular advantages of easy sample preparation, a high resolution in reciprocal space and a good statistical accuracy of the collected data. The main advantage, however, is the possibility to perform in-situ measurements to follow the evolution of nanostructures at different temperatures or loads, in different environments or under processing conditions.

Selected examples from materials physics and materials chemistry (such as functionalized nanoparticles, mesoporous structures, polymeric ionic liquids, carbon fibers) are presented.