Seminar room of Institute of Electrical Engineering SAS
Abstract: Scattering-type scanning near-field optical microscopy (s-SNOM) has emerged as one of the key technologies to study the optical properties of physical, chemical and biological materials on the 10-nm length scale – far beyond the diffraction limit of light. With the development of Fourier transform infrared spectroscopy on the nanoscale (nano-FTIR), we have successfully extended s-SNOM towards a complete spectroscopic analysis tool that is capable of analyzing complex polymer nanostructures , biological materials, organic semiconductors and two-dimensional materials. Additionally, the modular design of the microscope enables a straight-forward realization of pump-probe near-field measurements and even the incorporation of existing light sources, e.g. synchrotron radiation.
This presentation will introduce the basic principle of near-field optical microscopy and nano-FTIR and address their impact and key applications in the field of organic, bio and 2D materials.