Pavilón QUTE, Auditórium – 2. poschodie, FÚ SAV
The microscopic characterization of two-dimensional materials, and low-dimensional matter in general, poses unique challenges but also opens unique new avenues that are different from those for 3-D bulk structures or on the surfaces of 3D crystals. In a two-dimensional material, all atoms are located at the surface and therefore interact with the environment, while at the same time a single atomic layer produces only a small contrast and is very susceptible to radiation damage. I will discuss insights to irradiation-induced modifications of graphene, which shed light onto the bonding mechanism in carbon [1-3] as well as on the knock-on damage mechanism . Moreover, controlled amorphization of graphene provides insight to the transition from an ordered to a disordered material . I will also discuss a new idea to circumvent radiation damage, based on low-dose imaging of repeatedly occuring atomic configurations . In addition, I will show initial results from a dual-probe scanning tunneling microscopy setup where a free-standing graphene membrane is probed simultaneously from opposing sides and at the closest point, the two probes are separated only by the thickness of the graphene membrane .
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