Exploring low-dimensional materials by high-resolution microscopy

Prof. Jannik C. Meyer (University of Vienna, Vienna)

Pavilón QUTE, Auditórium – 2. poschodie, FÚ SAV


The microscopic characterization of two-dimensional materials, and low-dimensional matter in general, poses unique challenges but also opens unique new avenues that are different from those for 3-D bulk structures or on the surfaces of 3D crystals. In a two-dimensional material, all atoms are located at the surface and therefore interact with the environment, while at the same time a single atomic layer produces only a small contrast and is very susceptible to radiation damage. I will discuss insights to irradiation-induced modifications of graphene, which shed light onto the bonding mechanism in carbon [1-3] as well as on the knock-on damage mechanism [4]. Moreover, controlled amorphization of graphene provides insight to the transition from an ordered to a disordered material [5]. I will also discuss a new idea to circumvent radiation damage, based on low-dose imaging of repeatedly occuring atomic configurations [6]. In addition, I will show initial results from a dual-probe scanning tunneling microscopy setup where a free-standing graphene membrane is probed simultaneously from opposing sides and at the closest point, the two probes are separated only by the thickness of the graphene membrane [7].

[1] J. Kotakoski, A. V. Krasheninnikov, U. Kaiser, J. C. Meyer, Phys. Rev. Lett. 106, 105505 (2011).
[2] J. Kotakoski, J. C. Meyer, S. Kurasch, et al, Phys. Rev. B 83, 245420 (2011).
[3] J. Kotakoski, C. Mangler, J. C. Meyer, Nature Communications 5, 3991 (2014).
[4] J. C. Meyer et al., Phys. Rev. Lett. 108, 196102 (2012).
[5] F. Eder, J. Kotakoski, U. Kaiser, J. C. Meyer, Scientific Reports 4, Art. No. 4060 (2014).
[6] J. C. Meyer, J. Kotakoski, C. Mangler, Ultramicroscopy 145, p. 13 (2014).
[7] F. Eder et al., Nano Letters 13 (5), pp 1934–1940 (2013).

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